Instrumentation & Measurement Expert Panel Session - New Horizons, Needs, Challenges and Outlooks

Wednesday, May 16, 1:20 PM

This session entitled: “Instrumentation & Measurement Expert Panel Session - New Horizons, Needs, Challenges and Outlooks” is a new initiative which is being undertaken to introduce attendees to some of the real issues facing the broader fields of Instrumentation & Measurement. I2MTC attendees, many of whom are: a) academicians who are involved in R&D, b) engaged in industries developing instrumentation for specific applications, and c) in the business of developing metrological standards for the broader measurement fields, will have the opportunity to hear from and engage with experts about the outlook, needs, requirements and potential impediments facing these fields, now and in the future.

Panel Members

 

Charles (Chuck) Farrar

Director Los Alamos National Laboratory’s (LANL) Engineering Institute

Deyona "Dee" Hays

Founder, President/CEO Excellence Engineering, LLC & American Veteran Solutions

Dr. Upendra N. Singh

NASA Technical Fellow NASA Engineering and Safety Center, NASA Langley Research Center

Jeff Stahmann

Senior Fellow in Research and Development Boston Scientific

Alan Steele

Chief Metrologist National Research Council of Canada